Characterization of Polystyrene Thin Films Using X-Ray Reflectivity Undergraduate Researcher

Thin films of polystyrene on silicon substrate were investigated for thickness-dependent interface properties. To better understand the desirable electrical, mechanical, and optical properties of a polymer thin film, the interfacial structures must be first understood. Using x-ray reflectivity, data from polystyrene-air and polystyrene-silicon interfaces were collected and correlated with a theoretical model. An atomic force microscopy study of one sample was also undertaken as a complementary measurement to x-ray reflectivity. Results show that the structure of the thin film is dependent on the deposition method used to create the samples, as well as the polymer chemistry of polystyrene.